AZOM2y
ZEISS Crossbeam-FIB-SEM for High Throughput 3D Analysis and Sample Preparation
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AZOM2y
ZEISS Crossbeam 340 and Crossbeam 540 FIB-SEM-Microscopes
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Helsinki4y
Electron Microscopes.
Zeiss Crossbeam 550 with GEMINI II electron optics is optimized for fast high-resolution low-kV imaging. The microscope is equipped with Gallium - Focused Ion Beam (FIB) for 3D EM imaging. It features ...
AZoNano7y
ZEISS Crossbeam: FIB-SEM for High Throughput 3D Analysis and Sample Preparation
During imaging, milling, or when performing 3D analytics, the Crossbeam accelerates the FIB applications. The new EDS module enables conducting 3D analytics. While variable pressure capabilities can ...