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Now, a team of researchers led by Professor Huang Xian from the School of Precision Instrument and Opto-electronics ...
Conventional testing approaches face major limitations, with some methods damaging wafer surfaces irreversibly, while others ...
A majority of biomimetic membranes used for current biophysical studies rely on planar structures such as supported lipid bilayer (SLB) and self-assembled monolayers (SAMs). While they have ...
MilliBox the leader in compact benchtop mmWave and sub-THz antenna test systems continues to show innovation for the 2025 edition of the IEEE MTT-S International Microwave Symposium in San Francisco ...
Pickering shares five expert-backed reasons reed relays outperform in wafer probe and parametric test environments Leading manufacturer of high performance reed relays, Pickering Electronics has ...
Wafer Map Failure Pattern Recognition and Similarity Ranking for Large-Scale Data Sets - IEEE Xplore
Wafer maps can exhibit specific failure patterns that provide crucial details for assisting engineers in identifying the cause of wafer pattern failures. Conventional approaches of wafer map failure ...
Recent research applying deep learning to the field of defect pattern recognition in wafer maps has greatly accelerated the process of defect detection. However, when different defects are mixed on ...
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