(E) Scanning electron microscope (SEM) image of the culture medium channels–porous membrane–tissue chambers. Credit Na Liu, School of Mechatronic Engineering and Automation, Shanghai University.

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

Jun 15, 2023: Laser-induced graphenization technique advances electrofluidic paths in microfluidic paper-based devices (Nanowerk Spotlight) Microfluidic paper-based analytical devices (µPADs) are a ...

More Accurate And Detailed Analysis of Semiconductor Defects In SEM Images Using SEMI-PointRend. March 10th, 2023 - By: Technical Paper Link. A technical paper titled “SEMI-PointRend: Improved ...