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Abstract: This paper reports the temperature influence on the Back Enhanced (BE) SOI MOSFET fabricated with two different source/drain contact electrodes: Ohmic and Schottky. The BE SOI MOSFET (Patent ...
We report a temperature-dependent comparison of the annealed and nonannealed ohmic contacts for low-noise InP HEMTs. Contact resistances of annealed Ge/Au/Ni/Au and nonannealed Ti/Pt/Au ohmic contacts ...
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