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On-wafer transmission line pulsing (TLP) measurements and transient interferometric mapping experiments on vertically integrated DMOS transistors reveal the presence of hot filament hopping between ...
This letter reports the forward bias AC stress-induced effects of NO2 p-type doped and Al2O3 layer passivated diamond metal-oxide-semiconductor field-effect transistors (MOSFETs) demonstrating 100 h ...
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