Now, a team of researchers led by Professor Huang Xian from the School of Precision Instrument and Opto-electronics ...

On-wafer probing techniques have become indispensable in the precise characterisation of semiconductor devices operating in the microwave and terahertz regions.

Diverse optical wafer defect inspection systems including (a) Brightfield/darkfield imaging system, (b) Dark-field imaging with null ellipsometry, (c) Through-focus scanning imaging microscopy, (d ...

NORTH READING, Mass., March 31, 2025--Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test ...

The EVOLVITY 300 simplifies on-wafer probing with its compact, easy-to-use design, developed specifically for RF/DC modeling and device charact.

As we shift to photonic beams for wafer probing, we're laying the groundwork for a new phase in semiconductor testing. It's a journey of learning and adapting, and I'm glad to be part of it." ...

Keysight Technologies, Inc. (NYSE: KEYS) introduces the InfiniiMax 4 Series high-bandwidth oscilloscope probes, expanding its portfolio of high-freque ...