In the tungsten source SEM, any nonconductive specimen is coated with a very thin layer of conductive material in order to provide a pathway for the negatively charged electrons to escape the beam ...

In order to use the full functionality of the FE-SEM, the specimens must be mounted securely to the specimen holder. This prevents the specimen from falling off the stage if the tilt function is used, ...

The JSM-F100 incorporates our highly regarded In-lens Schottky Plus FE electron gun and "Neo Engine"(electron optical control system) as well as a new GUI "SEM Center" and an innovative "LIVE-AI ...

Michael Rauscher, Senior Director of the ZEISS Microscopy Materials Science Division, speaks to AZoM about field emission scanning electron microscopy - what ... design is an integral part of any of ...